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Characterization of Materials

MSE 505

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A multidisciplinary course offering a practical introduction to techniques of imaging structure and compositional analysis of advanced materials. Focus on principles and applications of various characterization methods. Covered topics include AFM, SEM, TEM, XRD, EDX/WDX, EELS, Raman, Ellipsometry, Confocal Microscopy, sample preparation and image processing, etc. Hands-on experience is emphasized.
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Section L01